Research data supporting "Structural properties of thin-film ferromagnetic topological insulators"

Carly Richardson, James Devine-Stoneman, Giorgio Divitini, Mary Vickers, CZ Chang, Mario Amado Montero, JS Moodera & Jason Robinson
High-resolution X-ray diffractometry and scanning transmission electron microscopy data, taken on thin films of ferromagnetic topological insulators. The aim of the study was to investigate the influence of substrate choice, film thickness and doping on the unit cell parameters, for a range typically used in electronic devices.
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