In Situ Transmission Electron Microscopy Data of Dislocations in Imperfectly Attached PbTe Nanocrystal Pairs

Justin Ondry, Matthew Hauwiller & A. Paul Alivisatos
Dataset containing high resolution transmission electron microscopy data of imperfectly attached PbTe nanocrystals. The data contains High Resolution TEM timeseries of images showing the annealing of of well defined b=a/2[110] edge dislocations in PbTe nanocrystal pairs viewed down the<001> zone axis. Depending on the attachment facets of the particles, the dislocations anneal out at different rates. In addition we performed geometric phase analysis on the images to visualize the strain fields surrounding the dislocation cores....
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