Microstructure design for fast lifetime measurements of magnetic tunneling junctions

Andrés Conca Parra, Frederick Casper, Johannes Paul, Ronald Lehndorff, Christian Haupt, Gerhard Jakob, Mathias Kläui & Burkard Hillebrands
The estimation of the reliability of magnetic field sensors against failure is a critical point concerning their application for industrial purposes. Due to the physical stochastic nature of the failure events, this can only be done by means of a statistical approach which is extremely time consuming and prevents a continuous observation of the production. Here, we present a novel microstructure design for a parallel measurement of the lifetime characteristics of a sensor population. By...
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