Systematic investigation of unexplained scattering in TOF-SESANS measurements

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The development of SESANS as a measurement probe of structures with length scales in the size range of 100nm-20micrometers has progressed steadily over the past 5-10 years. The current drive to incorporate data analysis code into the standard SANS analysis package SASView is part of an significant effort to make the technique more accessible to the SANS user community. There is however an on-going problem with the analysis of time-of-flight SESANS data when compared to...
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